DocumentCode :
751514
Title :
Access to industrial process periphery via Java for process control (JFPC)
Author :
Kleines, Harald ; Wüstner, Peter ; Settke, Kirsten ; Zwoll, Klaus
Author_Institution :
Zentrallabor fur Elektron., Forschungszentrum Julich GmbH, Germany
Volume :
49
Issue :
2
fYear :
2002
fDate :
4/1/2002 12:00:00 AM
Firstpage :
465
Lastpage :
468
Abstract :
Using Java for real world I/O requires its availability in real-time (RT) systems. It is widely accepted that in a plain Java environment, RT characteristics get lost and the required programming interfaces are missing. So there are several ongoing standardization efforts for RT Java. An essential aspect (also important for non-RT systems) is the access to external I/Os. The Siemens product Java for process control (JFPC), which is based on the ideas of OLE for process control (OPC) addresses this aspect. It is available under the proprietary RT kernel RMOS and under Windows NT. Forschungszentrum Julich developed different JFPC providers in order to access industrial components via PROFIBUS DP using an experimental version of JFPC under Linux. The paper presents the status of the different standardization efforts for RT Java and the key features of JFPC. It describes the implementation of a JFPC provider for PROFIBUS DP and shows how it can be used to access industrial sensors and actuators. Experiences and performance results are discussed
Keywords :
Java; operating system kernels; peripheral interfaces; process control; real-time systems; JFPC; JFPC providers; Java environment; Java for process control; Linux; OLE for process control; OPC; PROFIBUS DP; RT Java; RT characteristics; Siemens product; Windows NT; actuators; external I/Os; industrial components; industrial process periphery; industrial sensors; programming interfaces; proprietary RT kernel RMOS; real world I/O; real-time systems; standardization efforts; Actuators; Electrical equipment industry; Industrial control; Java; Kernel; Linux; Process control; Real time systems; Sensor phenomena and characterization; Standardization;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.1003775
Filename :
1003775
Link To Document :
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