DocumentCode :
751529
Title :
An experimental study of sidewall adhesion in microelectromechanical systems
Author :
Timpe, Shannon J. ; Komvopoulos, Kyriakos
Author_Institution :
Dept. of Mech. Eng., Univ. of California, Berkeley, CA, USA
Volume :
14
Issue :
6
fYear :
2005
Firstpage :
1356
Lastpage :
1363
Abstract :
A surface micromachine was designed specifically for studying sidewall adhesion in microelectromechanical systems (MEMS). The dependence of surface adhesion on contact load and ambient conditions was investigated under quasistatic normal loading conditions. Insight was obtained into the relative contributions of van der Waals and capillary forces to the measured adhesion force. Several shortcomings in previous adhesion studies of MEMS were overcome, and measurement of the true adhesion force was achieved under different testing conditions. The present experimental procedure enables the isolation of the van der Waals component of the adhesion force and the determination of the contributions of both contacting and noncontacting asperities to the total adhesion force at the inception of surface separation. The major benefits of the developed experimental methodology and surface micromachine are discussed in the context of adhesion results obtained for different values of apparent contact pressure, ambient pressure, and relative humidity.
Keywords :
adhesion; capillarity; micromachining; micromechanical devices; stiction; van der Waals forces; adhesion force; capillary forces; microelectromechanical systems; sidewall adhesion; surface adhesion; surface micromachine; surface separation; van der Waals forces; Adhesives; Force measurement; Humidity; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Microstructure; Rough surfaces; Surface cracks; Surface topography; Adhesion; ambient pressure; capillary forces; contact pressure; microelectromechanical devices; relative humidity; stiction; van der Waals forces;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2005.859076
Filename :
1549870
Link To Document :
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