• DocumentCode
    751565
  • Title

    A field iterative method for computing the scattered electric fields at the apertures of large perfectly conducting cavities

  • Author

    Reuster, Daniel D. ; Thiele, Gary A.

  • Author_Institution
    Dept. of Electr. Eng., Dayton Univ., OH, USA
  • Volume
    43
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    286
  • Lastpage
    290
  • Abstract
    An iterative method is developed for computing the scattered electric fields at the apertures of large perfectly conducting cavities. The field iterative method (FIM) uses Kirchhoff´s approximation to initiate a two stage iterative process (i.e., the method of successive approximations), involving both the magnetic field integral equation and the electric field integral equation, to calculate the electric currents on the internal cavity walls and the electric fields across the aperture of the cavity. The technique combines the flexibility of the boundary-integral method with the speed necessary to efficiently analyze large scale cavity problems. The paper presents the general theory, and applies the technique to the problem of TE scattering from two-dimensional perfectly conducting cavities
  • Keywords
    approximation theory; boundary integral equations; conducting materials; electric current; electric fields; electromagnetic wave scattering; iterative methods; magnetic fields; 2D perfectly conducting cavities; Kirchhoff´s approximation; TE scattering; apertures; boundary-integral method; electric currents; electric field integral equation; electric fields; field iterative method; internal cavity walls; large perfectly conducting cavities; magnetic field integral equation; scattered electric field; successive approximations; Apertures; Current; Integral equations; Iterative methods; Kirchhoff´s Law; Large-scale systems; Magnetic analysis; Magnetic fields; Scattering; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.371998
  • Filename
    371998