Title :
Quasi-three-dimensional method of moments for analyzing electromagnetic wave scattering in microwave tomography systems
Author :
Hu, Jin-Lin ; Wu, Zhipeng ; McCann, Hugh ; Davis, Lionel Edward ; Xie, Cheng-Gang
fDate :
4/1/2005 12:00:00 AM
Abstract :
A new quasi-three-dimensional method of moments (Quasi-3-D MoM) for analyzing electromagnetic wave scattering from a cylindrical dielectric object surrounded by a dipole array in microwave tomography systems is presented in this paper. A wire-volumetric electric field integral equation is derived for the electromagnetic wave scattering phenomena in microwave tomography systems. The new method is based on the MoM and involves rectangular cylindrical cells modeling the cylindrical object. The distribution of electric flux densities along the axial direction of cylindrical cells is expanded as a Fourier series multiplied by an attenuation factor, which is one part of basis functions. Therefore, the Quasi-3-D MoM is performed in a two-dimensional discretization, and the computational complexity is reduced. Detailed mathematical steps along with some numerical results are presented to illustrate the efficacy and accuracy of this approach.
Keywords :
Fourier series; computational complexity; dielectric bodies; electric field integral equations; electromagnetic wave scattering; method of moments; microwave imaging; tomography; 2D discretization; Fourier series; attenuation factor; cylindrical dielectric object; dipole array; electric flux density; electromagnetic wave scattering; microwave tomography systems; quasi-3D method of moments; rectangular cylindrical cells; wire-volumetric electric field integral equation; Attenuation; Dielectrics; Electromagnetic analysis; Electromagnetic scattering; Fourier series; Integral equations; Microwave antenna arrays; Microwave theory and techniques; Moment methods; Tomography; Dielectric object; Fourier series; dipole array; electric field integral equation; electromagnetic wave scattering; method of moments (MoM); microwave tomography;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2004.842294