DocumentCode
751742
Title
Embedded robustness IPs for transient-error-free ICs
Author
Dupont, Eric ; Nicolaidis, Michael ; Rohr, Peter
Author_Institution
iRoC Technologies
Volume
19
Issue
3
fYear
2002
Firstpage
54
Lastpage
68
Keywords
Atomic measurements; Cosmic rays; Neutrons; Protection; Robustness; Sea level; Sea surface; Semiconductor devices; Semiconductor materials; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2002.1003798
Filename
1003798
Link To Document