Title :
Multiport through-resistor (TR) numerical calibration
Author :
Li, Lin ; Wu, Ke
Author_Institution :
Dept. of Electr. Eng., Ecole Polytechnique de Montreal, Que., Canada
Abstract :
A multiport through-resistor (TR) numerical calibration technique is proposed and presented. The multiport TR calibration is used to remove the effects of port discontinuities in a deterministic method-of-moments (MOM) algorithm and can be easily combined with commercial full-wave MOM simulators. Analytical equations for multiport TR calibration are derived in this work. Three-dimensional characteristic impedance of a microstrip coupled line is calculated and showcased as an example by using the proposed scheme and its validity is verified.
Keywords :
S-parameters; calibration; method of moments; microstrip lines; multiport networks; network analysis; transfer function matrices; 3D characteristic impedance; deterministic method-of-moments algorithm; microstrip coupled line; multiport through-resistor numerical calibration; port discontinuities; Calibration; Circuit simulation; Coupling circuits; Equations; Impedance; Message-oriented middleware; Microstrip; Moment methods; Symmetric matrices; Voltage; Coupled line; full-wave simulator; method of moments (MoM); multiport circuit; numerical calibration technique;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2005.859978
