DocumentCode :
751890
Title :
Transient processes and noise in a tomography system: an analytical case study
Author :
Gonzalez-Nakazawa, Alejandro ; Gamio, Jose Carlos ; Yang, Wuqiang
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
Volume :
5
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
321
Lastpage :
329
Abstract :
This paper presents an analysis and optimization of an ac-based electric capacitance tomography system. The existing system can capture image data up to 250 frames/s. However, even higher acquisition rates, say 2000 frames/s are desirable for some applications. To optimize the system design, a transient process analysis is performed for every analog stage to determine the settling time and an approach is suggested to minimize it. Noise analysis is also performed to ensure that the signal-to-noise ratio of the system does not degrade. In both cases, results are validated by simulation using PSpice and/or by experiment, showing that the settling time of the overall system could be reduced from 4.4 to 1 ms, offering a faster data acquisition rate of 1000 frames/s.
Keywords :
SPICE; capacitance measurement; data acquisition; image processing; integrated circuit noise; tomography; transient analysis; PSpice; ac electric capacitance tomography system; circuit analysis; noise analysis; transient process analysis; Capacitance measurement; Capacitive sensors; Circuit noise; Computer aided software engineering; Data acquisition; Electrical capacitance tomography; Low pass filters; Signal to noise ratio; Transient analysis; Voltage; Capacitance tomography; circuit analysis; noise analysis; optimization; transient process analysis;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2004.842623
Filename :
1411813
Link To Document :
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