• DocumentCode
    751921
  • Title

    Breakdown voltage-time characteristics and insulation testing of gas insulated switchgear

  • Author

    Okabe, Shigemitsu ; Takami, Jun ; Tsuboi, Toshihiro

  • Author_Institution
    R&D Center, Yokohama
  • Volume
    15
  • Issue
    3
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    741
  • Lastpage
    748
  • Abstract
    There is not sufficient data on the breakdown voltage-time characteristics for gas insulated swiitchgear (GIS) at power-frequency voltages, especially in the long-term region, for complete insulation specifications to be developed. This paper gives voltage- time breakdown characteristics for a 72-kV GIS at power-frequency voltages, both for clean conditions and with metallic particles added, from times of the order of a second to times of the order of 1000 hours. The Weibull parameters were calculated to be n = 95 and a = 0.32 to 0.47 in the clean case; and in the metallic-particle case n = 31 and a = 0.92 to 0.98 for a short-term region and n = 66 and a = 0.40 to 0.47 for a long-term region, with the boundary between these two regions located at 10 minutes. Based on the statistics for the metallic-particle case, the reliability of the power-frequency withstand voltage tests were then estimated using as examples the GIS in a 500-kV system (an effectively grounded system) and a 66-kV system (a non-effectively grounded system). The paper also studied the effect of the type of grounding and the influence of the presence of metallic particles on the test voltage level.
  • Keywords
    Weibull distribution; electric breakdown; gas insulated switchgear; insulation testing; GIS; Weibull parameters; breakdown voltage-time characteristics; gas insulated switchgear; insulation testing; metallic particles; power-frequency voltages; voltage tests; Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Gas insulation; Geographic Information Systems; Insulation testing; Lightning; Power system reliability; Switchgear; System testing;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2008.4543111
  • Filename
    4543111