DocumentCode
751921
Title
Breakdown voltage-time characteristics and insulation testing of gas insulated switchgear
Author
Okabe, Shigemitsu ; Takami, Jun ; Tsuboi, Toshihiro
Author_Institution
R&D Center, Yokohama
Volume
15
Issue
3
fYear
2008
fDate
6/1/2008 12:00:00 AM
Firstpage
741
Lastpage
748
Abstract
There is not sufficient data on the breakdown voltage-time characteristics for gas insulated swiitchgear (GIS) at power-frequency voltages, especially in the long-term region, for complete insulation specifications to be developed. This paper gives voltage- time breakdown characteristics for a 72-kV GIS at power-frequency voltages, both for clean conditions and with metallic particles added, from times of the order of a second to times of the order of 1000 hours. The Weibull parameters were calculated to be n = 95 and a = 0.32 to 0.47 in the clean case; and in the metallic-particle case n = 31 and a = 0.92 to 0.98 for a short-term region and n = 66 and a = 0.40 to 0.47 for a long-term region, with the boundary between these two regions located at 10 minutes. Based on the statistics for the metallic-particle case, the reliability of the power-frequency withstand voltage tests were then estimated using as examples the GIS in a 500-kV system (an effectively grounded system) and a 66-kV system (a non-effectively grounded system). The paper also studied the effect of the type of grounding and the influence of the presence of metallic particles on the test voltage level.
Keywords
Weibull distribution; electric breakdown; gas insulated switchgear; insulation testing; GIS; Weibull parameters; breakdown voltage-time characteristics; gas insulated switchgear; insulation testing; metallic particles; power-frequency voltages; voltage tests; Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Gas insulation; Geographic Information Systems; Insulation testing; Lightning; Power system reliability; Switchgear; System testing;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2008.4543111
Filename
4543111
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