Title :
Built-in current testing
Author :
Maly, Wojciech ; Patyra, Marek
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
3/1/1992 12:00:00 AM
Abstract :
Built-in current (BIC) testing has proven to be useful through a number of IC fabrication experiments. In this paper the experience gained from these experiments is summarized
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; CMOS ICs; IC fabrication experiments; built-in current testing; system partitioning; CMOS technology; Circuit faults; Circuit testing; Design optimization; Electrical fault detection; Fabrication; Fault detection; Hardware; Integrated circuit testing; Voltage measurement;
Journal_Title :
Solid-State Circuits, IEEE Journal of
