DocumentCode
752106
Title
Multi-resolution wavelet analysis for chopped impulse voltage measurements and feature extraction
Author
Onal, Emel ; Kalenderli, Ozcan ; Seker, Serhat
Author_Institution
Electr. Eng. Dept., Istanbul Tech. Univ., Istanbul
Volume
15
Issue
3
fYear
2008
fDate
6/1/2008 12:00:00 AM
Firstpage
893
Lastpage
900
Abstract
In this study, an application of the wavelet transform based on the multi-resolution analysis (MRA) is aimed for evaluation of amplitude and time parameters of the chopped impulse voltage. In terms of getting data set, three types of the chopped lightning impulse voltages with different chopping times are considered and MRA is applied to these data as different case studies. Hence, some characteristic properties are extracted from the impulse waveforms at some special frequency values. In this sense, frequency component of 33 MHz is found with the maximum peak value for each case before the chopping time and their appearing times for three cases are determined using the time-frequency analysis. Hence the difference between the chopping time and occurring time of the maximum peak values at 33 MHz is calculated easily. Also, some physical interpretations of the frequency component of 33 MHz are defined through the circuit parameters of the measurement system. In usual application, the MRA can be presented as a powerful technique to extract the noise effects, which come from different sources, in the high voltage measurements.
Keywords
feature extraction; lightning; time-frequency analysis; voltage measurement; wavelet transforms; chopped lightning impulse voltage measurement; feature extraction; measurement system; multi resolution wavelet transform; time-frequency analysis; Circuits; Data mining; Feature extraction; Frequency measurement; Lightning; Multiresolution analysis; Time frequency analysis; Voltage measurement; Wavelet analysis; Wavelet transforms;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2008.4543128
Filename
4543128
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