Title :
Spectral beam combining of a single-mode 980-nm laser array for pumping of erbium-doped fiber amplifiers
Author :
Salet, Paul ; Lucas-Leclin, Gaëlle ; Roger, Gérard ; Georges, Patrick ; Bousselet, Philippe ; Simonneau, Christian ; Bayart, Dominique ; Michel, Nicolas ; Auzanneau, Sophie-Charlotte ; Calligaro, Michel ; Parillaud, Olivier ; Lecomte, Michel ; Krakowski,
Author_Institution :
CNRS, Univ. Paris-Sud, Orsay, France
fDate :
4/1/2005 12:00:00 AM
Abstract :
With a view to improve the power level and brightness of semiconductor pump lasers, we have resorted to a scalable implementation and achieved spectral beam combining through a low-quality-factor external cavity. For that purpose, a high-power single-mode laser array emitting up to 2.1 W at 3.2 A at 980 nm has been realized, which delivers 1.5 W in external cavity. A power of 0.66 W was finally coupled into the single-mode fiber, with a coupling efficiency of 44%. Pumping experiments of an erbium-doped fiber amplifier utilizing this laser have demonstrated efficiency and noise characteristics similar to what is usually obtained with conventional sources, with the noteworthy advantage of a lower gain excursion over the C-band.
Keywords :
Q-factor; brightness; erbium; laser beams; laser cavity resonators; laser modes; laser noise; optical fibre amplifiers; optical fibre couplers; optical pumping; semiconductor device noise; semiconductor laser arrays; 0.66 W; 1.5 W; 2.1 W; 3.2 A; 980 nm; brightness; coupling efficiency; erbium-doped fiber amplifiers; low gain excursion; low-quality-factor external cavity; noise characteristics; optical pumping; semiconductor pump lasers; single-mode fiber; single-mode laser array; spectral beam combining; Brightness; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Laser beams; Laser excitation; Laser noise; Optical arrays; Power lasers; Pump lasers; Semiconductor laser arrays; Diode arrays; erbium-doped fiber amplifiers (EDFAs); external cavity; semiconductor laser;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.843936