• DocumentCode
    752463
  • Title

    Numerical modeling of plasma sheath phenomena in the presence of secondary electron emission

  • Author

    Jolivet, Laurent ; Roussel, Jean-Françcois

  • Author_Institution
    Space Environ. Dept., ONERA, Toulouse, France
  • Volume
    30
  • Issue
    1
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    318
  • Lastpage
    326
  • Abstract
    The steady-state, sheath between a Maxwellian plasma source and a dielectric surface was simulated numerically in the collisionless hypothesis. A method of nonphysical numerical time evolution was investigated to extend the electrostatic particle-in-cell method to a large range of ion masses at low cost in calculation time. Secondary electron emission effects were also considered and all of these results for a Maxwellian plasma were validated by comparison with previous analytical models in the entire range of ion masses and with other numerical simulations in the case of light ions. The occurrence of instabilities resulting from the interaction between the ion and the secondary electron flows was also investigated. The numerical times method was thus validated and its limitations characterized. It is now available to simulate arbitrary distribution functions of electrons, secondary electrons, and ions at low cost in calculation time
  • Keywords
    plasma dielectric properties; plasma production; plasma sheaths; plasma simulation; secondary electron emission; Maxwellian plasma source; analytical models; collisionless hypothesis; dielectric surface; distribution functions; electrostatic particle-in-cell method; ion masses; nonphysical numerical time evolution; numerical modeling; numerical simulation; numerical times method; plasma sheath phenomena; secondary electron emission; steady-state sheath; Costs; Dielectrics; Electrons; Electrostatics; Numerical models; Numerical simulation; Plasma sheaths; Plasma simulation; Plasma sources; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.1003876
  • Filename
    1003876