A radiation-hardened 16/32-bit microprocessor

Author

Hass, K.J. ; Treece, R.K. ; Giddings, A.E.

Author_Institution

Sandia Nat. Lab., Albuquerque, NM, USA

Volume

36

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

2252

Lastpage

2257

Abstract

A single-chip radiation-hardened 16/32-bit microprocessor (the SA3300) has been designed, fabricated, and tested. The SA3300 is designed to withstand high levels of ionizing radiation and is resistant to single-event upset (SEU) caused by heavy ions. New techniques were used to improve immunity to SEU effects in combinational logic. Testing has demonstrated that the SA3300 is functional after a total gamma dose of 5 Mrad(Si). The device does not suffer latchup from SEU, and parts without SEU resistors have an SEU linear energy transfer (LET) upset threshold greater than 28 MeV/mg/cm²

Keywords

MOS integrated circuits; VLSI; gamma-ray effects; integrated circuit technology; ion beam effects; microprocessor chips; radiation hardening (electronics); 16 bit; 32 bit; 5E6 rad; SA3300; SEU linear energy transfer; combinational logic; gamma dose; high levels of ionizing radiation; immunity to SEU; resistant to single-event upset; upset threshold; Circuit simulation; Immunity testing; Laboratories; Logic design; Logic devices; Microprocessors; Resistors; Single event upset; Temperature distribution; Timing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.45432

Filename

45432