A model for proton-induced SEU

The authors present a method for predicting proton-induced single-event upset (SEU) rates in devices exposed to given proton fluxes, within a particular spacecraft shielding. The approach uses experimental heavy-ion cross-section data, combined with nuclear reaction calculations, in order to determine the proton-induced SEU cross section versus proton energy relationship. Calculations for two devices, the Fairchild 93L422 RAM and the Intel 2164A dynamic RAM, for which heavy-ion test data were available, are presented and compared with other theoretical results and with ground-based experimental data. Available on-orbit SEU data are then compared with the present predictions. Predicted SEU rates for both protons and cosmic rays at various 60° circular orbits are also compared. Good agreement is found in all cases