DocumentCode :
752568
Title :
Modeling the heavy ion upset cross section
Author :
Connel, L.W. ; McDaniel, P.J. ; Prinja, A.K. ; Sexton, F.W.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
42
Issue :
2
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
73
Lastpage :
82
Abstract :
The standard Rectangular Parallelepiped (RPP) construct is used to derive a closed form expression for, σ¯(θ, φ, L) the directional-spectral heavy ion upset cross section. This is an expected value model obtained by integrating the point-value cross section model, σ(θ,φ,L), also developed here, with the Weibull density function, f(E), assumed to govern the stochastic behavior of the upset threshold energy, E. A comparison of σ¯(θ,φ,L) with experimental data show good agreement, lending strong credibility to the hypothesis that E-randomness is responsible for the shape of the upset cross section curve. The expected value model is used as the basis for a new, rigorous mathematical formulation of the effective cross section concept. The generalized formulation unifies previous corrections to the inverse cosine scaling, collapsing to Petersen´s correction, [cosθ-(h/l)sinθ]-1, near threshold and Sexton´s, [cosθ+(h/l) sin θ]-1, near saturation. The expected value cross section model therefore has useful applications in both upset rate prediction and test data analysis
Keywords :
heavy ion-nucleus reactions; nuclear physics; statistical models (nuclear); stochastic processes; E-randomness; Petersen´s correction; Rectangular Parallelepiped construct; Weibull density function; directional-spectral heavy ion upset cross section; heavy ion upset cross section modeling; inverse cosine scaling; point-value cross section model integration; saturation; upset threshold energy stochastic behaviour; Data analysis; Density functional theory; Helium; Laboratories; Mathematical model; Predictive models; Shape; Single event upset; Stochastic processes; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.372135
Filename :
372135
Link To Document :
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