Title :
Passivity-Based Stabilization of a 1-DOF Electrostatic MEMS Model With a Parasitic Capacitance
Author :
Wickramasinghe, I.P.M. ; Maithripala, D.H.S. ; Kawade, B.D. ; Berg, J.M. ; Dayawansa, W.P.
Author_Institution :
Dept. of Mech. Eng. & Nano Tech Center, Texas Tech Univ., Lubbock, TX
Abstract :
Feedback control of electrostatic microelectromechanical systems (MEMS) is significantly complicated by the presence of parasitics. This paper considers the stabilization of a one-degree-of-freedom (1-DOF) piston actuator under the influence of a capacitively coupled parasitic electrode. Previous work by the authors has shown that, in the absence of parasitics, passivity-based control may be used to make any feasible equilibrium point of this system globally asymptotically stable. However parasitics may destabilize the nominal closed-loop system by inducing multiple equilibrium points, causing a saddle-node bifurcation called charge pull-in. This note shows how the nominal passivity-based control formulation may be modified to eliminate the multiple equilibria and prevent charge pull-in. As in previous work, we consider both static and dynamic output feedback controllers, with the dynamic controller providing additional control over transient performance.
Keywords :
asymptotic stability; capacitance; closed loop systems; electrodes; feedback; micromechanical devices; pistons; 1-DOF electrostatic MEMS model; capacitively coupled parasitic electrode; charge pull-in; control formulation; dynamic controller; dynamic output feedback controller; electrostatic microelectromechanical systems; global asymptotic stability; multiple equilibria; multiple equilibrium points; nominal closed loop system; nominal passivity; one-degree-of-freedom piston actuator; parasitic capacitance; passivity based stabilization; saddle node bifurcation; static output feedback controller; Bifurcation; charge pull-in; control; electrostatic; microelectromechanical systems (MEMS); parasitics; passivity;
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2008.924571