DocumentCode
753022
Title
Robust VLSI circuit simulation techniques based on overlapped waveform relaxation
Author
Fang, Wen ; Mokari, M. Ebrahim ; Smart, David
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio Univ., Athens, OH, USA
Volume
14
Issue
4
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
510
Lastpage
518
Abstract
High-performance mainframe computers are commonly implemented using bipolar VLSI technologies. The simulation of such circuits is very time-consuming using traditional direct methods, as in SPICE. Relaxation-based methods such as waveform relaxation (WR) have been used to speed up the simulation of MOS circuits, but they have not been as effective for bipolar circuits because of the strong coupling between logic gates. In this paper, a fast, robust overlapped waveform relaxation (OWR) algorithm is presented. OWR is effective for bipolar circuits because it uses an overlapped partitioning strategy to overcome the effect of strong coupling on convergence speed. To demonstrate the effectiveness of this algorithm, simulation results are presented for combinational and sequential digital bipolar circuits as well as analog bipolar circuits. From the simulation results, it can be concluded that the speed advantage of OWR compared to the direct method increases with circuit size. The OWR algorithm is more robust than standard WR; it converges in cases where WR diverges or converges too slowly. OWR is about two times faster than WR for tightly coupled bipolar circuits
Keywords
VLSI; bipolar analogue integrated circuits; bipolar digital integrated circuits; circuit analysis computing; combinational circuits; convergence of numerical methods; iterative methods; logic partitioning; sequential circuits; analog bipolar circuits; bipolar VLSI technologies; combinational digital bipolar circuits; convergence speed; overlapped partitioning strategy; overlapped waveform relaxation algorithm; robust VLSI circuit simulation techniques; sequential digital bipolar circuits; Circuit simulation; Computational modeling; Convergence; Coupling circuits; Logic circuits; Logic gates; Partitioning algorithms; Robustness; SPICE; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.372377
Filename
372377
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