Title :
Measurement of the facet modal reflectivity spectrum in high quality semiconductor traveling wave amplifiers
Author :
Merritt, S.A. ; Dauga, C. ; Fox, S. ; Wu, I.-F. ; Dagenais, M.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
fDate :
3/1/1995 12:00:00 AM
Abstract :
We demonstrate that the Hakki-Paoli technique, commonly used for measuring single pass gain in semiconductor lasers, can be modified to measure facet modal reflectivity down to 10-6 in semiconductor laser amplifiers. We also introduce a new technique based on Fourier and Hilbert transformations of the spontaneous emission spectrum (the SET method) which enhances the signal-to-noise ratio and permits modal reflectivity measurements down to 10-1
Keywords :
Fourier transforms; Hilbert transforms; laser variables measurement; reflectivity; semiconductor lasers; spontaneous emission; travelling wave amplifiers; Fourier transformations; Hakki-Paoli technique; Hilbert transformations; facet modal reflectivity spectrum; high quality semiconductor traveling wave amplifiers; laser diode amplifers; modal reflectivity measurements; semiconductor laser amplifiers; semiconductor lasers; signal-to-noise ratio; single pass gain; spontaneous emission spectrum; Coatings; Density measurement; Gain measurement; Laser modes; Optical waveguides; Polarization; Reflectivity; Semiconductor optical amplifiers; Spontaneous emission; Waveguide lasers;
Journal_Title :
Lightwave Technology, Journal of
