Title :
Optimization of Low-Voltage Metallized Film Capacitor Geometry
Author :
Vuillermet, Y. ; Chadebec, O. ; Lupin, J.M. ; Saker, A. ; Meunier, G. ; Coulomb, J.l.
Author_Institution :
ENSIEG, Grenoble
fDate :
4/1/2007 12:00:00 AM
Abstract :
Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is first established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization, coupling losses computing and finite-element method, is led in order to find parameters that give the best lifespan and the larger reactive power provided. Very interesting new geometries have been found out; they allow an increase in reactive power greater than the increase in volume
Keywords :
current distribution; finite element analysis; reactive power; thin film capacitors; capacitor failures; capacitor temperature mapping; coupling loss; electrode current distribution; finite element method; low-voltage metallized film capacitor geometry; numerical simulation; reactive power; shape optimization; thermal constraint; Capacitors; Current distribution; Electrodes; Geometry; Metallization; Numerical simulation; Optimization methods; Reactive power; Shape; Temperature distribution; Capacitor lifespan; capacitor losses; metallized film capacitors; shape optimization;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2007.892473