Title :
Analysis of the phase noise in saturated SOAs for DPSK applications
Author :
Wei, Xing ; Zhang, Liming
Author_Institution :
Lucent Technol., Bell Labs., Murray Hill, NJ, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
A theoretical model is used to analyze the impact of phase noise on the performance of semiconductor optical amplifiers (SOAs) in the saturation regime for differential phase-shift keying (DPSK) applications. It is found that the variance of the differential phase error scales as T2/τc2 for τc≫T, where T is the bit period and τc is the carrier lifetime of the SOA. This suggests that the adverse effect of saturation-induced phase noise can be significantly reduced by increasing the bit rate or the carrier lifetime.
Keywords :
carrier lifetime; differential phase shift keying; optical communication equipment; optical modulation; phase noise; semiconductor device models; semiconductor device noise; semiconductor optical amplifiers; DPSK; bit rate; carrier lifetime; differential phase error; differential phase-shift keying; phase noise; saturated SOA; semiconductor optical amplifiers; Charge carrier lifetime; Differential phase shift keying; Differential quadrature phase shift keying; Noise generators; Optical crosstalk; Optical distortion; Optical noise; Optical saturation; Phase noise; Semiconductor optical amplifiers; Charge carrier lifetime; differential phase-shift keying (DPSK); semiconductor optical amplifier (SOA);
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2005.843943
