Title :
Simultaneous measurement of the linewidth, linewidth enhancement factor α, and FM and AM response of a semiconductor laser
Author :
Krüger, Udo ; Krüger, Kristen
Author_Institution :
Heinrich-Hertz-Inst. fur Nachrichtentech. Berlin GmbH, Germany
fDate :
4/1/1995 12:00:00 AM
Abstract :
Using a commercially available computer controlled spectrum analyser with tracking generator, optical input section, and optical delay line it is possible to measure the linewidth, linewidth enhancement factor α, and FM and AM response of a semiconductor laser in one process. The determination of the linewidth yields also information about the frequency noise density and the determination of a delivers information about the nonlinear gain. Assuming an optical input power of 0 dBm, a laser linewidth <50 MHz and a modulation response of the laser without cut-off, AM indices m>0.01% and FM deviations of about >10 MHz up to 20 GHz can be detected
Keywords :
amplitude modulation; frequency modulation; laser noise; laser variables measurement; nonlinear optics; optical modulation; physics computing; semiconductor device noise; semiconductor lasers; spectral analysers; spectral line breadth; AM response; FM response; commercially available computer controlled spectrum analyser; frequency noise density; laser linewidth; linewidth enhancement factor; modulation response; nonlinear gain; optical delay li; optical input power; optical input section; semiconductor laser; simultaneous measurement; tracking generator; Delay lines; Frequency modulation; Laser beam cutting; Laser noise; Nonlinear optics; Optical computing; Optical control; Optical noise; Power lasers; Semiconductor lasers;
Journal_Title :
Lightwave Technology, Journal of