DocumentCode
754093
Title
EMI conducted emission in the differential mode emanating from an SCR: phenomena and noise level prediction
Author
Scheich, Roland ; Roudet, James
Author_Institution
ABB Henschel AG, Mannheim, Germany
Volume
10
Issue
2
fYear
1995
fDate
3/1/1995 12:00:00 AM
Firstpage
105
Lastpage
110
Abstract
This paper deals with an EMC analysis of a power converter. In particular, the phenomena and modeling of conducted noise emission caused by an SCR (silicon controlled rectifier) are described. Theoretical results in the time as well as frequency domain are discussed and compared to the time signal measured and its spectrum
Keywords
electromagnetic compatibility; electromagnetic interference; frequency-domain analysis; thyristor convertors; time-domain analysis; EMC analysis; EMI conducted emission; SCR; conducted noise emission; differential mode; frequency domain analysis; noise level prediction; power converter; silicon controlled rectifier; time domain analysis; time signal spectrum; Circuit noise; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiation; Frequency; Noise level; Rectifiers; Semiconductor device noise; Thyristors; Voltage;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/63.372595
Filename
372595
Link To Document