• DocumentCode
    754098
  • Title

    Probabilistic distances between finite-state finite-alphabet hidden Markov models

  • Author

    Xie, Li ; Ugrinovskii, Valery A. ; Petersen, Ian R.

  • Author_Institution
    Sch. of Inf. Technol. & Electr. Eng., Univ. of New South Wales, Canberra, ACT, Australia
  • Volume
    50
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    505
  • Lastpage
    511
  • Abstract
    This note considers the problem of evaluating a probabilistic distance between discrete-time, homogeneous, first-order, finite-state finite-alphabet hidden Markov models (HMMs). Our approach is based on a correspondence between probability measures and HMMs established in this note. Using a probability measure transformation technique, we obtain recursive expressions for the relative entropy between the marginal probability distributions of two HMMs under consideration. Also, the relative entropy rate, as the limit of the time-averaged value of the above relative entropy, is obtained. These expressions are given in terms of the parameters of the given HMMs. Furthermore, we show that the probabilistic distance between HMMs used in the existing literature admits a representation in terms of a conditional expectation given the observation sequence. This representation allows us to evaluate this distance using an information state approach.
  • Keywords
    entropy; hidden Markov models; probability; finite-state finite-alphabet hidden Markov model; marginal probability distribution; probabilistic distances; probability measure transformation technique; recursive expression; relative entropy; Australia Council; Control theory; Entropy; Extraterrestrial measurements; Filtration; Hidden Markov models; Information technology; Probability distribution; Speech processing; Statistics; Change of measure; hidden Markov models (HMMs); information state; probabilistic distance;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/TAC.2005.844896
  • Filename
    1412009