• DocumentCode
    754103
  • Title

    Modeling buffer layer IGBTs for circuit simulation

  • Author

    Hefner, Allen R., Jr.

  • Author_Institution
    Semiconductor Electron. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    10
  • Issue
    2
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    123
  • Abstract
    The dynamic behavior of commercially available buffer layer IGBTs is described. It is shown that buffer layer IGBTs become much faster at high voltages than nonbuffer layer IGBTs with similar low voltage characteristics. Because the fall times specified in manufacturers´ data sheets do not reflect the voltage dependence of switching speed, a new method of selecting devices for different circuit applications is suggested. A buffer layer IGBT model is developed and implemented into the Saber circuit simulator, and a procedure is developed to extract the model parameters for buffer layer IGBTs. It is shown that the new buffer layer IGBT model can be used to describe the dynamic behavior and power dissipation of buffer layer IGBTs in user-defined application circuits. The results of the buffer layer IGBT model are verified using commercially available IGBTs
  • Keywords
    circuit analysis computing; insulated gate bipolar transistors; power semiconductor switches; semiconductor device models; Saber circuit simulator; buffer layer IGBT modelling; circuit simulation; dynamic behavior; low voltage characteristics; power dissipation; switching devices; switching speed; user-defined application circuits; Buffer layers; Capacitance; Circuit simulation; Electron emission; Insulated gate bipolar transistors; Knee; MOSFET circuits; NIST; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/63.372596
  • Filename
    372596