• DocumentCode
    754512
  • Title

    Experimental Study of a Silver Layer on an Antireflection Subwavelength-Structured Surface

  • Author

    Ting, Chia-Jen ; Chen, Chi-Feng ; Chou, C.P.

  • Author_Institution
    Mech. Eng. Dept., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    20
  • Issue
    13
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1196
  • Lastpage
    1198
  • Abstract
    The optical characteristics of a silver layer deposited on an antireflection subwavelength-structured surface are investigated. The experimental results of the reflectance and the transmittance of several different thicknesses of silver layer on the subwavelength-structured surface are carried out. A subwavelength structure with the spatial period and diameter of about 230 nm and height of about 150 nm on polyethylene terphthalate film is fabricated by microreplication process. It is shown that such an element with the suitable silver layer deposited on an antireflection subwavelength-structured surface has high transmittance and low glare in the visible spectral range and high reflectance in the infrared range. Obviously, the optical film with silver layer can not only obtain the high performance of heat insulation but also give an application in automobile and house windows.
  • Keywords
    antireflection coatings; optical films; reflectivity; silver; Ag; antireflection coating; infrared spectra; microreplication process; reflectance; silver; transmittance; visible spectra; Chemical technology; Insulation; Mechanical engineering; Optical films; Optical refraction; Optical surface waves; Optical variables control; Reflectivity; Silver; Transistors; Antireflection; heat insulation; nanostructure; subwavelength structure;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.925185
  • Filename
    4544842