Title :
Measurement of Facet Reflectivity Through Reflection Gain in Fabry–PÉrot Laser Diode
Author :
Jeong, Jong Sool ; Lee, Hak-Kyu ; Lee, Chang-Hee
Author_Institution :
KT Second Res. Center, Novera Opt. Korea, Inc., Daejeon
fDate :
7/15/2008 12:00:00 AM
Abstract :
We propose a simple and useful method to measure the facet reflectivity in a Fabry-Perot laser diode (LD). The new measurement method does not require information on LD parameters such as threshold current or optical spectrum. The measurement is based on a simple formula that describes the relationship of facet reflectivity and reflection gain with launching the probe beam of a narrow spectral width.
Keywords :
Fabry-Perot interferometers; reflectivity; reflectometry; semiconductor lasers; Fabry-Perot laser diode; facet reflectivity; narrow spectral width; optical spectrum; reflection gain; threshold current; Coatings; Diode lasers; Gain measurement; Optical coupling; Optical reflection; Probes; Reflectivity; Semiconductor optical amplifiers; Stimulated emission; Threshold current; Fabry–PÉrot laser diode (F-P LD); facet reflectivity; reflection gain;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2008.925508
