DocumentCode
754743
Title
Analyzing Functional Coverage in Bounded Model Checking
Author
Grosse, Daniel ; Kuhne, Ulrich ; Drechsler, Rolf
Author_Institution
Bremen Univ., Bremen
Volume
27
Issue
7
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
1305
Lastpage
1314
Abstract
Formal verification is an important issue in circuit and system design. In this context, bounded model checking (BMC) is one of the most successful techniques. However, even if all the specified properties can be verified, it is difficult to determine whether they cover the complete functional behavior of a design. We propose a practical approach to analyze coverage in BMC. The approach can easily be integrated in a BMC tool with only minor changes. In our approach, a coverage property is generated for each important signal. If the considered properties do not describe the signal´s entire behavior, the coverage property fails, and a counter example is generated. From the counter example, an uncovered scenario can be derived. This way, the approach also helps in design understanding. We demonstrate our method for a reduced instruction set computer (RISC) CPU. First, the coverage of the block-level verification is considered. Second, it is demonstrated how the technique can be applied on a higher level. Therefore, we investigate the instruction set verification of the RISC CPU. The experiments show that the costs for coverage analysis are comparable to the verification costs. Based on the results, we identified coverage gaps during the verification. We were able to close all of them and achieved 100% functional coverage in total.
Keywords
formal verification; reduced instruction set computing; RISC CPU; block-level verification; bounded model checking; formal verification; functional coverage; instruction set verification; reduced instruction set computer; Boolean functions; Context modeling; Costs; Counting circuits; Data structures; Formal verification; Logic; Reduced instruction set computing; Signal generators; State-space methods; Boolean satisfiability (SAT); bounded model checking (BMC); formal verification; functional coverage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2008.925790
Filename
4544863
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