• DocumentCode
    754777
  • Title

    Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines

  • Author

    Kim, Taehoon ; Eo, Yungseon

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan
  • Volume
    27
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1214
  • Lastpage
    1227
  • Abstract
    Analytical compact-form models for the signal transients and crosstalk noise of inductive-effect-prominent multicoupled lines are developed. Capacitive and inductive coupling effects are investigated and formulated in terms of the effective single-transmission-line model and effective transmission line parameters for fundamental switching modes. Arbitrary switching multicoupled lines are readily decomposed with the fundamental modes by using a symbolic operation, followed by the signal transients and crosstalk noise of multicoupled lines with the closed-form expressions that are derived by using a waveform approximation technique. It is shown that the models have excellent agreement with SPICE simulation.
  • Keywords
    RLC circuits; SPICE; circuit CAD; crosstalk; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; transient analysis; transmission lines; RLC interconnect lines; SPICE simulation; analytical CAD models; capacitive coupling effects; closed-form expressions; crosstalk noise; effective transmission line parameters; inductive coupling effects; inductive-effect-prominent multicoupled lines; signal transients; switching modes; symbolic operation; waveform approximation technique; Analytical models; Closed-form solution; Couplings; Crosstalk; Image analysis; Power system transients; SPICE; Signal analysis; Transient analysis; Transmission lines; Crosstalk; inductance effect; interconnect lines; signal transient; transmission lines;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.923094
  • Filename
    4544867