DocumentCode :
754777
Title :
Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines
Author :
Kim, Taehoon ; Eo, Yungseon
Author_Institution :
Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan
Volume :
27
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
1214
Lastpage :
1227
Abstract :
Analytical compact-form models for the signal transients and crosstalk noise of inductive-effect-prominent multicoupled lines are developed. Capacitive and inductive coupling effects are investigated and formulated in terms of the effective single-transmission-line model and effective transmission line parameters for fundamental switching modes. Arbitrary switching multicoupled lines are readily decomposed with the fundamental modes by using a symbolic operation, followed by the signal transients and crosstalk noise of multicoupled lines with the closed-form expressions that are derived by using a waveform approximation technique. It is shown that the models have excellent agreement with SPICE simulation.
Keywords :
RLC circuits; SPICE; circuit CAD; crosstalk; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; transient analysis; transmission lines; RLC interconnect lines; SPICE simulation; analytical CAD models; capacitive coupling effects; closed-form expressions; crosstalk noise; effective transmission line parameters; inductive coupling effects; inductive-effect-prominent multicoupled lines; signal transients; switching modes; symbolic operation; waveform approximation technique; Analytical models; Closed-form solution; Couplings; Crosstalk; Image analysis; Power system transients; SPICE; Signal analysis; Transient analysis; Transmission lines; Crosstalk; inductance effect; interconnect lines; signal transient; transmission lines;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.923094
Filename :
4544867
Link To Document :
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