DocumentCode :
755102
Title :
Performance and optimization of dipole heterostructure field-effect transistor
Author :
Zou, Junping ; Dong, Haozhe ; Gopinath, Anand ; Shur, Michael
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Volume :
39
Issue :
2
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
250
Lastpage :
256
Abstract :
Dipole heterostructure field effect transistors (dipole HFETs) have been fabricated in AlGaAs/GaAs. Doped p++ and n++ planes in the charge control AlGaAs layer form a dipole that creates a considerably larger barrier between the channel and the gate than in conventional heterostructure FETs. This leads to a sharp reduction of the forward-biased gate current in enhancement-mode n-channel devices, a much broader transconductance peak, and a higher maximum drain current in enhancement-mode devices. The authors also outline an analytical theory, supported by numerical modeling, for the optimization of device structures for both enhancement- and depletion-mode devices. This is supported by experimental results obtained from enhancement devices
Keywords :
III-V semiconductors; aluminium compounds; field effect transistors; gallium arsenide; semiconductor device models; AlGaAs-GaAs; channel gate barrier; charge control AlGaAs layer; depletion-mode devices; device structure optimisation; dipole HFETs; dipole heterostructure field-effect transistor; doped p++ and n++ planes; drain current; enhancement-mode devices; experimental results; forward biased gate current reduction; numerical modeling; planar doped dipole; semiconductors; transconductance peak; Gallium arsenide; HEMTs; Leakage current; MESFETs; MODFETs; Microwave devices; Schottky barriers; Space technology; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.121680
Filename :
121680
Link To Document :
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