• DocumentCode
    75515
  • Title

    Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

  • Author

    Quinn, Heather M. ; Black, D.A. ; Robinson, William H. ; Buchner, Stephen P.

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos, NM, USA
  • Volume
    60
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    2119
  • Lastpage
    2142
  • Abstract
    As of 2013, the gold standard for assessing radiation-hardness assurance (RHA) for a system, subsystem, or a component is accelerated radiation testing and/or pulsed laser testing. Fault injection tools, which include both fault simulation and emulation tools, have become more common in the last 15 years. Fault simulation tools use analytical methods for assessing RHA, whereas fault emulation uses hardware methods. Both fault simulation and emulation allow designers to augment traditional RHA techniques to determine whether circuit designs, microarchitectures, components, and application-specific integrated circuits (ASICs) meet the requirements for a particular mission. Fault simulation and emulation can provide the designers the luxury of testing on the benchtop without the time and financial constraints of accelerated radiation testing. This paper explores how to design, implement, and validate a fault simulation or emulation system. The paper ends with several case studies of currently used fault simulation and emulation systems.
  • Keywords
    application specific integrated circuits; fault simulation; radiation hardening (electronics); AD 2013; application specific integrated circuit; circuit component; circuit design; circuit microarchitecture; fault emulation tool; fault injection tool; fault simulation tool; pulsed laser testing; radiation hardness assurance testing; Adders; Circuit faults; Emulation; Integrated circuit modeling; Life estimation; Microprocessors; Testing; Emulation; fault diagnosis; radiation hardening; simulation;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2259503
  • Filename
    6519339