Title :
A simplified algorithm for leaky network analyzer calibration
Author :
Ferrero, A. ; Sanpietro, F.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
fDate :
4/1/1995 12:00:00 AM
Abstract :
A new algorithm for network analyzer calibration is presented. The error model includes leakage effects and can be applied to a general n-port NWA. The 2-port 16-term model becomes a special case of this new technique which is also hopefully suitable for the calibration problems of multiport on-wafer probing systems. Experimental results testify the effectiveness of the new approach
Keywords :
S-parameters; calibration; microwave measurement; network analysers; test equipment; 2-port 16-term model; error model; leakage effects; leaky network analyzer calibration; multiport onwafer probing systems; n-port network analyser; Algorithm design and analysis; Calibration; Equations; Error correction; Helium; Laser sintering; Measurement standards; Scattering; Switches; Testing;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
