Title :
Multichannel texture analysis using localized spatial filters
Author :
Bovik, Alan Conrad ; Clark, Marianna ; Geisler, Wilson S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fDate :
1/1/1990 12:00:00 AM
Abstract :
A computational approach for analyzing visible textures is described. Textures are modeled as irradiance patterns containing a limited range of spatial frequencies, where mutually distinct textures differ significantly in their dominant characterizing frequencies. By encoding images into multiple narrow spatial frequency and orientation channels, the slowly varying channel envelopes (amplitude and phase) are used to segregate textural regions of different spatial frequency, orientation, or phase characteristics. Thus, an interpretation of image texture as a region code, or carrier of region information, is emphasized. The channel filters used, known as the two-dimensional Gabor functions, are useful for these purposes in several senses: they have tunable orientation and radial frequency bandwidths and tunable center frequencies, and they optimally achieve joint resolution in space and in spatial frequency. By comparing the channel amplitude responses, one can detect boundaries between textures. Locating large variations in the channel phase responses allows discontinuities in the texture phase to be detected. Examples are given of both types of texture processing using a variety of real and synthetic textures
Keywords :
encoding; filtering and prediction theory; pattern recognition; channel amplitude responses; discontinuities; encoding; irradiance patterns; joint resolution; localized spatial filters; multichannel texture analysis; pattern recognition; radial frequency bandwidths; region code; region information; tunable center frequencies; tunable orientation; two-dimensional Gabor functions; visible textures; Demodulation; Frequency; Image analysis; Image segmentation; Image texture; Image texture analysis; Layout; Shape; Spatial filters; Surface texture;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on