DocumentCode :
755651
Title :
Analysis of antireflection coatings using the FD-TD method with the PML absorbing boundary condition
Author :
Yamauchi, Junji ; Mita, Makoto ; Aoki, Shin Ichi ; Nakano, Hisamatsu
Author_Institution :
Coll. of Eng., Hosei Univ., Tokyo, Japan
Volume :
8
Issue :
2
fYear :
1996
Firstpage :
239
Lastpage :
241
Abstract :
A step-index optical waveguide with an antireflection coating is analyzed using the finite-difference time-domain (FD-TD) method combined with the perfectly matched layer absorbing boundary condition (PML-ABC). It is demonstrated that the numerical simulations having a dynamic range over that for the Mur absorbing boundary condition can be obtained for a single-layer coating. The analysis of a double-layer coating reveals the transient behavior of reflected fields.
Keywords :
antireflection coatings; finite difference time-domain analysis; optical films; optical waveguide theory; reflectivity; refractive index; FD-TD method; Mur absorbing boundary condition; PML absorbing boundary condition; antireflection coatings; double-layer coating; dynamic range; finite-difference time-domain method; numerical simulations; perfectly matched layer absorbing boundary condition; reflected field transient behaviour; single-layer coating; step-index optical waveguide; Boundary conditions; Coatings; Dynamic range; Electromagnetic waveguides; Finite difference methods; Optical reflection; Optical waveguides; Perfectly matched layers; Reflectivity; Time domain analysis;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.484253
Filename :
484253
Link To Document :
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