DocumentCode
755787
Title
Comparison of Simple Approximations and Numerical Solutions for the Threshold Voltage of Ion-Implanted Long-Channel MOSFET´s
Author
Brodfuehrer, Brian P. ; Galloway, Kenneth F. ; Wilson, Charles L.
Volume
27
Issue
1
fYear
1984
Firstpage
3
Lastpage
6
Abstract
The very simple approximations used for calculating the threshold voltage shifts for ion-implanted long-channel MOSFET´s in classroom discussions are compared to the results of a more exact numerical simulation. Limited experimental measurements are compared to the calculated threshold voltage shifts.
Keywords
Channel bank filters; Doping profiles; Implants; MOSFET circuits; NIST; Numerical simulation; Physics; Poisson equations; Silicon; Threshold voltage;
fLanguage
English
Journal_Title
Education, IEEE Transactions on
Publisher
ieee
ISSN
0018-9359
Type
jour
DOI
10.1109/TE.1984.4321649
Filename
4321649
Link To Document