Temperature Profiling of VCSELs by Thermoreflectance Microscopy

Author

Farzaneh, M. ; Amatya, Reja ; Luerszen, D. ; Greenberg, Kathryn J. ; Rockwell, Whitney E. ; Hudgings, Janice A.

Author_Institution

Dept. of Phys., Mount Holyoke Coll., South Hadley, MA

Volume

19

Issue

8

fYear

2007

fDate

4/15/2007 12:00:00 AM

Firstpage

601

Lastpage

603

Abstract

Surface temperature measurements with submicron spatial resolution are reported for operating vertical-cavity surface-emitting lasers (VCSELs) by means of thermoreflectance microscopy. We measure increasingly convex radial temperature distributions with increasing bias power for three types of VCSELs. The corresponding convex refractive index profiles are consistent with previously observed thermal lensing; this effect is far more prominent for the oxide confined single-mode (SM) VCSEL than for the broader aperture devices. For all samples, the change in the average surface temperature varies linearly with the change in dissipated power. A comparison with the temperature of the top distributed Bragg reflector mirror of an oxide confined SM VCSEL, obtained from the wavelength shift of the spontaneous emission, shows that both methods yield comparable results

Keywords

refractive index; semiconductor lasers; surface emitting lasers; temperature distribution; temperature measurement; thermoreflectance; VCSEL; distributed Bragg reflector mirror; refractive index; surface temperature measurement; thermoreflectance microscopy; vertical-cavity surface-emitting lasers; Microscopy; Power measurement; Refractive index; Samarium; Spatial resolution; Surface emitting lasers; Temperature distribution; Temperature measurement; Thermoreflectance; Vertical cavity surface emitting lasers; Temperature; thermoreflectance; vertical-cavity surface-emitting lasers (VCSELs);

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2007.894348

Filename

4139641