• DocumentCode
    756071
  • Title

    Applications of the upside-down normal loss function

  • Author

    Drain, David ; Gough, Andrew M.

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • Volume
    9
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    143
  • Lastpage
    145
  • Abstract
    The upside-down normal loss function (UDNLF) is a weighted loss function that has accurately modeled losses in a product engineering context. The function´s scale parameter can be adjusted to account for the actual percentage of material failing to work at specification limits. Use of the function along with process history allows the prediction of expected loss-the average loss one would expect over a long period of stable process operation. Theory has been developed for the multivariate loss function (MUDNLF), which can be applied to optimize a process with many parameters-a situation in which engineering intuition is often ineffective. Computational formulae are presented for expected loss given normally distributed process parameters (correlated or uncorrelated), both in the univariate and multivariate cases
  • Keywords
    economics; integrated circuit manufacture; integrated circuit yield; semiconductor process modelling; expected loss; multivariate loss function; normally distributed process parameters; process history; process optimization; product engineering context; scale parameter; specification limits; upside-down normal loss function; weighted loss function; Context modeling; Costs; Distributed computing; Etching; History; MOSFETs; Manufacturing processes; Microcontrollers; Pulp manufacturing; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.484295
  • Filename
    484295