DocumentCode :
756226
Title :
Accelerated AC degradation of impregnated PP films
Author :
Gosse, B. ; Gosse, J.-P.
Volume :
2
Issue :
6
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
1075
Lastpage :
1082
Abstract :
The influence of the liquid, its impurities and additives on the AC degradation of impregnated polypropylene (PP) films has been investigated. Aging of polypropylene was performed at 80°C, 135 MV/m in model capacitors filled with benzyltoluene saturated with O2 in order to increase the aging rate. The thermal oxidation of the liquid has been studied by gas chromatography, the oxidation of PP by FTIR microspectroscopy, the degradation rate of PP films has been evaluated by the variation of their mean breakdown voltage with aging time. All of them are strongly enhanced by the electric field. The oxidation of the liquid which takes place during these experiments influences only slightly the PP degradation rate. It is concluded that these severe conditions of aging do not change the chemical process. They only enhance drastically its propagation rate. Since aging of PP films is due to the scission of macromolecular chains initiated by radicals formed at the electrodes, the influence of the liquid, its components or additives is explained by their ability to react with radicals which initiate the scission of the macromolecules
Keywords :
Fourier transform spectra; ageing; chromatography; dielectric thin films; electric breakdown; electric fields; impurities; insulation testing; life testing; organic insulating materials; oxidation; polymer films; power capacitors; 80 C; FTIR microspectroscopy; accelerated AC degradation; additives; aging rate; benzyltoluene; degradation rate; electric field; gas chromatography; impregnated polypropylene films; impurities; liquid; macromolecular chain scission; mean breakdown voltage; model capacitors; radicals; thermal oxidation; Acceleration; Aging; Electric breakdown; Electrodes; Impurities; Infrared detectors; Oxidation; Power capacitors; Thermal degradation; Thermal stresses;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.484309
Filename :
484309
Link To Document :
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