DocumentCode
756364
Title
Pulse propagation in superconducting coplanar striplines
Author
Baiocchi, Orlando R. ; Kong, Keon-Shik ; Itoh, Tatsuo
Author_Institution
Dept. of Electr. & Electron. Eng., California State Univ., Chico, CA, USA
Volume
40
Issue
3
fYear
1992
fDate
3/1/1992 12:00:00 AM
Firstpage
509
Lastpage
514
Abstract
The phenomenological loss equivalence method (PEM), the enhanced two-fluid model for thin-film superconducting materials, and the dynamical calculation of radiation losses in planar structures are used-in the context of a linear filter approach-to model attenuation and dispersion of ultrafast pulses in coplanar striplines. The numerical simulation of this modeling shows excellent agreement with experimental results available in the literature. Simple relationships between the peak attenuation and delay time of the propagation pulse, and penetration depth at absolute zero and conductivity at critical temperature may open the possibility of using pulse distortion to characterize thin-film, high-temperature superconducting materials
Keywords
delays; guided electromagnetic wave propagation; high-temperature superconductors; losses; penetration depth (superconductivity); superconducting devices; superconducting thin films; superconducting transition temperature; waveguide theory; conductivity; critical temperature; delay time; dispersion; dynamical calculation; enhanced two-fluid model; high-temperature superconducting materials; linear filter approach; model; numerical simulation; peak attenuation; penetration depth; phenomenological loss equivalence; planar structures; propagation pulse; pulse distortion; pulse propagation; radiation losses; superconducting coplanar striplines; thin-film superconducting materials; ultrafast pulses; Attenuation; Context modeling; Delay effects; High temperature superconductors; Nonlinear filters; Numerical simulation; Stripline; Superconducting filters; Superconducting materials; Superconducting thin films;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.121726
Filename
121726
Link To Document