Title :
CMOS Smart Sensor for Monitoring the Quality of Perishables
Author :
Ueno, Ken ; Hirose, Tetsuya ; Asai, Tetsuya ; Amemiya, Yoshihito
Author_Institution :
Dept. of Electr. Eng., Hokkaido Univ., Sapporo
fDate :
4/1/2007 12:00:00 AM
Abstract :
We developed a CMOS integrated-circuit sensor to monitor the change in quality of perishables that depends on surrounding temperatures. Our sensor makes use of the fact that the temperature dependence of the subthreshold current in MOSFETs is analogous to that of the degradation of perishables. The sensor is attached to perishable goods such as farm and marine products and is distributed from producers to consumers along with the goods. During their distribution process, the sensor measures the surrounding temperatures and emulates the degradation of the goods caused by the temperature. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. Our sensor consists of subthreshold CMOS circuits with a low-power consumption of 10 muW or lower
Keywords :
CMOS integrated circuits; goods distribution; intelligent sensors; quality control; temperature sensors; CMOS smart sensor; MOSFET; low-power consumption; perishable goods; perishables quality monitoring; quality guarantee; subthreshold CMOS circuits; subthreshold current; temperature measurement; Circuits; Degradation; Intelligent sensors; MOSFETs; Monitoring; Subthreshold current; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; CMOS; perishable; quality guarantee; smart sensor; subthreshold current; translinear;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.891676
