Title :
Computer-Aided Optimization of Transistor Model Parameters
Abstract :
Coputer-aided adjustment of model parameter values to optimally match measured transistor data is described. The presentation is tutorial for student designers of semiconductor circuits who are not familiar with recent developments in the area of computer-aided network design. An illustrative program for the optimization of a bipolar transistor incremental model is described and demonstrated.
Keywords :
Bipolar transistors; Circuit analysis computing; Educational institutions; Frequency; Integrated circuit measurements; Integrated circuit modeling; Manufacturing; Optimization methods; Predictive models; Solid modeling;
Journal_Title :
Education, IEEE Transactions on
DOI :
10.1109/TE.1985.4321723
