DocumentCode :
756660
Title :
Surface Acoustic Waves in Reverse-Biased AlGaN/GaN Heterostructures
Author :
Shigekawa, Naoteru ; Nishimura, Kazumi ; Yokoyama, Haruki ; Hohkawa, Kohji
Author_Institution :
Dept. of NTT R&D Planning, NTT Corp., Atsugi
Volume :
55
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
1585
Lastpage :
1591
Abstract :
Properties of surface acoustic waves (SAWs) in reverse-biased AlGaN/GaN heterostructures on (0001) sapphire substrates were studied by examining the characteristics of SAW filters composed of interdigital Schottky and ohmic contacts. The fundamental and higher frequency SAW signals in measured -parameters were attributed to Rayleigh and Sezawa modes, respectively. The onsets of the SAW signals, which were close to the threshold voltage of HEMTs in the vicinities of the respective filters, changed in response to the spatial variation of the threshold voltage. The onset of Sezawa mode was deeper than that of Rayleigh mode, and the difference in onset was larger for longer SAW wavelengths. These results are possibly explained by the change of the input capacitance of interdigital transducers due to the reverse-bias voltages or by the difference in the distribution of SAW energy between the two modes.
Keywords :
Rayleigh waves; S-parameters; Schottky barriers; gallium compounds; high electron mobility transistors; ohmic contacts; sapphire; surface acoustic wave filters; AlGaN; GaN; HEMT; Rayleigh modes; S-parameters; SAW filters; SAW wavelengths; Sezawa modes; interdigital Schottky contacts; ohmic contacts; reverse-bias voltages; sapphire substrates; surface acoustic waves; Acoustic measurements; Acoustic waves; Aluminum gallium nitride; Frequency; Gallium nitride; Ohmic contacts; SAW filters; Sawing machines; Surface acoustic waves; Threshold voltage; AlGaN/GaN; SAW filter; heterostructure; interdigital transducer (IDT); surface acoustic wave (SAW); triple-transit echo (TTE);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2008.923565
Filename :
4545053
Link To Document :
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