Title :
Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis
Author :
Deb, Somnath ; Pattipati, Krishna R. ; Raghavan, Vijay ; Shakeri, Mojdeh ; Shrestha, Roshan
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fDate :
5/1/1995 12:00:00 AM
Abstract :
In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting
Keywords :
automatic test software; automatic testing; design for testability; failure analysis; fault diagnosis; minimax techniques; signal flow graphs; TEAMS software package; cause-effect dependency modeling; diagnostic strategies; fault diagnosis; hierarchical system schematics; hierarchical troubleshooting; multi-signal directed graphs; multisignal flow graphs; real-world; single fault; system integration; system testability analysis; Costs; Design engineering; Design for testability; Fault diagnosis; Flow graphs; Maintenance engineering; Observability; Performance analysis; System testing; Systems engineering and theory;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
