Title :
ITC 2004 panels: Part 1
Author_Institution :
Intel
Abstract :
Panel sessopms have long been part of the International Test Conference technical program; theyprovide an informal and entertaining opportunity for energetic ITC audiences to discuss and debate a wide range of subjects with industry and research experts. The ITC 2004 panels continued this tradition with an intriguing slate of panel sessions that educated the community and built interest in emerging issues while providing controversy and fun at the same time.
Keywords :
Analog computers; Circuit testing; Data handling; Design for testability; Logic testing; Manufacturing processes; Marine vehicles; Operational amplifiers; Semiconductor device manufacture; Subcontracting;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2005.41
