• DocumentCode
    756989
  • Title

    ITC 2004 panels: Part 1

  • Author

    Stolicny, Carol

  • Author_Institution
    Intel
  • Volume
    22
  • Issue
    2
  • fYear
    2005
  • Firstpage
    186
  • Lastpage
    189
  • Abstract
    Panel sessopms have long been part of the International Test Conference technical program; theyprovide an informal and entertaining opportunity for energetic ITC audiences to discuss and debate a wide range of subjects with industry and research experts. The ITC 2004 panels continued this tradition with an intriguing slate of panel sessions that educated the community and built interest in emerging issues while providing controversy and fun at the same time.
  • Keywords
    Analog computers; Circuit testing; Data handling; Design for testability; Logic testing; Manufacturing processes; Marine vehicles; Operational amplifiers; Semiconductor device manufacture; Subcontracting;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2005.41
  • Filename
    1413155
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=756989