DocumentCode :
757145
Title :
A new cluster isolation criterion based on dissimilarity increments
Author :
Fred, Ana L N ; Leitã, José M N
Author_Institution :
Instituto de Telecomunicaoes, Instituto Superior Tecnico, Lisbon, Portugal
Volume :
25
Issue :
8
fYear :
2003
Firstpage :
944
Lastpage :
958
Abstract :
This paper addresses the problem of cluster defining criteria by proposing a model-based characterization of interpattern relationships. Taking a dissimilarity matrix between patterns as the basic measure for extracting group structure, dissimilarity increments between neighboring patterns within a cluster are analyzed. Empirical evidence suggests modeling the statistical distribution of these increments by an exponential density; we propose to use this statistical model, which characterizes context, to derive a new cluster isolation criterion. The integration of this criterion in a hierarchical agglomerative clustering framework produces a partitioning of the data, while exhibiting data interrelationships in terms of a dendrogram-type graph. The analysis of the criterion is undertaken through a set of examples, showing the versatility of the method in identifying clusters with arbitrary shape and size; the number of clusters is intrinsically found without requiring ad hoc specification of design parameters nor engaging in a computationally demanding optimization procedure.
Keywords :
graph theory; pattern clustering; statistical analysis; cluster isolation criterion; dendrogram-type graph; dissimilarity increments; dissimilarity matrix; exponential density; hierarchical agglomerative clustering framework; interpattern relationships; model-based characterization; pattern clustering; statistical distribution; Clustering algorithms; Clustering methods; Context modeling; Design optimization; Machine learning algorithms; Partitioning algorithms; Pattern analysis; Prototypes; Shape; Statistical distributions;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2003.1217600
Filename :
1217600
Link To Document :
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