• DocumentCode
    75720
  • Title

    A Comparison of Two Excitation Modes for MEMS Electrothermal Displacement Sensors

  • Author

    Mohammadi, Ali ; Moheimani, S. O. Reza ; Yuce, Mehmet Rasit

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
  • Volume
    35
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    584
  • Lastpage
    586
  • Abstract
    MEMS electrothermal displacement sensors can be operated in constant current (CC) or constant voltage (CV) excitation modes. The CV mode is more commonly used. However, there have been reports that the CC excitation mode may lead to a larger measured signal, and thus, it may be a better choice than the CV mode. In this letter, we present an analytic comparison of the two methods, and show that from a signal-to-noise-ratio point of view, benefits of operating a sensor in CC mode are only marginal. The analytical investigation is supported by experiments performed on sensors integrated in a SOI-MEMS nanopositioner with low noise read out circuits, which leads to 0.04-nm/√Hz displacement resolution for both excitation modes.
  • Keywords
    constant current sources; displacement measurement; microsensors; nanopositioning; readout electronics; silicon-on-insulator; MEMS electrothermal displacement sensors; SOI-MEMS nanopositioner; constant current excitation mode; constant voltage excitation mode; low noise read out circuits; microelectromechancial systems; signal-to-noise-ratio; Analytical models; Micromechanical devices; Resistors; Signal to noise ratio; Temperature sensors; Micro-electromechancial systems (MEMS); electrothermal sensor; noise; noise.;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2313291
  • Filename
    6787062