DocumentCode
75720
Title
A Comparison of Two Excitation Modes for MEMS Electrothermal Displacement Sensors
Author
Mohammadi, Ali ; Moheimani, S. O. Reza ; Yuce, Mehmet Rasit
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
Volume
35
Issue
5
fYear
2014
fDate
May-14
Firstpage
584
Lastpage
586
Abstract
MEMS electrothermal displacement sensors can be operated in constant current (CC) or constant voltage (CV) excitation modes. The CV mode is more commonly used. However, there have been reports that the CC excitation mode may lead to a larger measured signal, and thus, it may be a better choice than the CV mode. In this letter, we present an analytic comparison of the two methods, and show that from a signal-to-noise-ratio point of view, benefits of operating a sensor in CC mode are only marginal. The analytical investigation is supported by experiments performed on sensors integrated in a SOI-MEMS nanopositioner with low noise read out circuits, which leads to 0.04-nm/√Hz displacement resolution for both excitation modes.
Keywords
constant current sources; displacement measurement; microsensors; nanopositioning; readout electronics; silicon-on-insulator; MEMS electrothermal displacement sensors; SOI-MEMS nanopositioner; constant current excitation mode; constant voltage excitation mode; low noise read out circuits; microelectromechancial systems; signal-to-noise-ratio; Analytical models; Micromechanical devices; Resistors; Signal to noise ratio; Temperature sensors; Micro-electromechancial systems (MEMS); electrothermal sensor; noise; noise.;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2014.2313291
Filename
6787062
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