DocumentCode :
75720
Title :
A Comparison of Two Excitation Modes for MEMS Electrothermal Displacement Sensors
Author :
Mohammadi, Ali ; Moheimani, S. O. Reza ; Yuce, Mehmet Rasit
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
Volume :
35
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
584
Lastpage :
586
Abstract :
MEMS electrothermal displacement sensors can be operated in constant current (CC) or constant voltage (CV) excitation modes. The CV mode is more commonly used. However, there have been reports that the CC excitation mode may lead to a larger measured signal, and thus, it may be a better choice than the CV mode. In this letter, we present an analytic comparison of the two methods, and show that from a signal-to-noise-ratio point of view, benefits of operating a sensor in CC mode are only marginal. The analytical investigation is supported by experiments performed on sensors integrated in a SOI-MEMS nanopositioner with low noise read out circuits, which leads to 0.04-nm/√Hz displacement resolution for both excitation modes.
Keywords :
constant current sources; displacement measurement; microsensors; nanopositioning; readout electronics; silicon-on-insulator; MEMS electrothermal displacement sensors; SOI-MEMS nanopositioner; constant current excitation mode; constant voltage excitation mode; low noise read out circuits; microelectromechancial systems; signal-to-noise-ratio; Analytical models; Micromechanical devices; Resistors; Signal to noise ratio; Temperature sensors; Micro-electromechancial systems (MEMS); electrothermal sensor; noise; noise.;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2014.2313291
Filename :
6787062
Link To Document :
بازگشت