• DocumentCode
    757282
  • Title

    Shallow Traps in {\\rm YAlO}_{3}:{\\rm Ce} Single Crystal Perovskites

  • Author

    Fasoli, Mauro ; Fontana, Ilaria ; Moretti, Federico ; Vedda, Anna ; Nikl, Martin ; Mihokova, Eva ; Zorenko, Yuriy V. ; Gorbenko, Vitalyi I.

  • Author_Institution
    Dept. of Mater. Sci., Univ. of Milano-Bicocca, Milan
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1114
  • Lastpage
    1117
  • Abstract
    The aim of this work is to investigate the influence of shallow traps on scintillating properties of YAlO3:Ce. Wavelength-resolved thermally stimulated luminescence measurements following X-ray irradiation at 10 K have been performed on both undoped and Ce-doped crystals. Different and composite glow curves and emission spectra were obtained. Following glow peaks analysis of YAlO3:Ce, their room temperature decay time was evaluated to be of the order of 10-4 s. The presence of an athermal tunneling recombination process between traps and Ce3+ ions below 100 K has been evidenced by phosphorescence decays.
  • Keywords
    cerium; electron traps; minerals; phosphorescence; radiation effects; solid scintillation detectors; thermoluminescence; tunnelling; vacancies (crystal); yttrium compounds; X-ray irradiation effects; YAP; YAlO3:Ce; athermal tunneling recombination process; charge carriers; composite glow curves; electron trap; emission spectra; oxygen vacancy; phosphorescence decays; scintillator timing characteristics; shallow defect traps; single crystal perovskites; temperature 10 K; wavelength-resolved thermally stimulated luminescence; Chromium; Crystals; Luminescence; Materials science and technology; Performance evaluation; Physics; Raw materials; Temperature; Tunneling; Wavelength measurement; Perovskites; YAP; scintillators; thermally stimulated luminescence;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.922818
  • Filename
    4545113