• DocumentCode
    757328
  • Title

    Computing and Minimizing Cache Vulnerability to Transient Errors

  • Author

    Zhang, Wei

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, Carbondale, IL
  • Volume
    26
  • Issue
    2
  • fYear
    2009
  • Firstpage
    44
  • Lastpage
    51
  • Abstract
    Using a cache vulnerability factor to measure the susceptibility of cache memories to transient errors at the architecture level can help designers make appropriate cost and reliability trade-offs at early design cycles. Two early write-back strategies can also improve the reliability of write-back data caches without compromising performance.
  • Keywords
    cache storage; reliability; cache memories; cache vulnerability; reliability trade-offs; transient errors; Cache memory; Computer crashes; Costs; Error correction; Frequency; Microprocessors; Protection; Reliability; Voltage; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.29
  • Filename
    4850410