DocumentCode :
757442
Title :
Physics of electron beam ion traps and sources
Author :
Currell, Fred ; Fussmann, Gerd
Author_Institution :
Dept. of Phys. & Astron., Queen´´s Univ. of Belfast, UK
Volume :
33
Issue :
6
fYear :
2005
Firstpage :
1763
Lastpage :
1777
Abstract :
This paper presents the basic physics underlying the operation of electron beam ion traps and sources, with the machine physics underlying their operation being described in some detail. Predictions arising from this description are compared with some diagnostic measurements.
Keywords :
electron beams; ion sources; magnetic traps; plasma sources; plasma-beam interactions; diagnostic measurements; electron beam ion traps; ion sources; machine physics; Electron beams; Electron traps; Ion beams; Ion sources; Ionization; Magnetic confinement; Magnetic fields; Physics; Space charge; Superconducting magnets; Electron beam ion source (EBIS); electron beam ion source/trap (EBIS/T); electron beam ion trap (EBIT); ion source; ion trap;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2005.860072
Filename :
1556668
Link To Document :
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