• DocumentCode
    757489
  • Title

    Analysis of the electromagnetic waves in an overmoded finite length slow wave structure

  • Author

    Amin, Md Ruhul ; Ogura, K. ; Kitamura, H. ; Minami, K. ; Watanabe, T. ; Carmel, Y. ; Main, W. ; Weaver, J. ; Destler, W.W. ; Granatstein, V.L.

  • Author_Institution
    Graduate Sch. of Sci. & Technol., Niigata Univ., Japan
  • Volume
    43
  • Issue
    4
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    815
  • Lastpage
    822
  • Abstract
    The electromagnetic fields of the higher order axial resonant modes in a slow wave structure are analyzed and found to have considerably different characteristics from those of the conventional fundamental mode. Here, the reflections at both ends produce axial resonant modes corresponding to axisymmetric transverse magnetic (TM) modes. The period of field modulation of some of the higher order axial modes is shorter than that of the usual mode in a cylindrical waveguide, which could be of practical interest for higher power, higher frequency operation of backward wave oscillators. A perturbation technique is used to ascertain the field distribution inside the resonant cavity, and the numerical results thus obtained are compared to some experimental data
  • Keywords
    backward wave oscillators; cavity resonators; electromagnetic field theory; perturbation techniques; slow wave structures; BWO; axisymmetric TM modes; backward wave oscillators; electromagnetic fields; electromagnetic waves; field distribution; field modulation period; higher order axial resonant modes; overmoded finite length structure; perturbation technique; resonant cavity; slow wave structure; transverse magnetic modes; Electromagnetic analysis; Electromagnetic fields; Electromagnetic reflection; Electromagnetic scattering; Electromagnetic waveguides; Frequency; Magnetic analysis; Magnetic resonance; Oscillators; Perturbation methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.375229
  • Filename
    375229