TlBr Gamma-Ray Spectrometers Using the Depth Sensitive Single Polarity Charge Sensing Technique

Author

Hitomi, Keitaro ; Onodera, Toshiyuki ; Shoji, Tadayoshi ; Hiratate, Yukio ; He, Zhong

Author_Institution

Dept. of Electron. & Intell. Syst., Tohoku Inst. of Technol., Sendai

Volume

55

Issue

3

fYear

2008

fDate

6/1/2008 12:00:00 AM

Firstpage

1781

Lastpage

1784

Abstract

Pixellated thallium bromide (TlBr) gamma-ray spectrometers were fabricated and evaluated with the depth sensitive single polarity charge sensing technique. The detectors exhibited energy resolutions of 2.22%, 1.22% and 1.11% for 356 keV, 662 keV and 1.33 MeV, respectively, at room temperature. Direct measurements of electron mobility-lifetime products in TlBr detectors were performed. An electron mobility-lifetime product of 4.1times10^-3 cm²/V was obtained from a TlBr detector.

Keywords

gamma-ray spectrometers; position sensitive particle detectors; semiconductor counters; TlBr gamma-ray spectrometers; depth sensitive single polarity charge sensing technique; electron mobility-lifetime product measurements; pixellated thallium bromide gamma-ray spectrometers; position-sensitive detector; Cathodes; Crystalline materials; Electron mobility; Energy resolution; Furnaces; Helium; Purification; Radiation detectors; Spectroscopy; Temperature; Position-sensitive detector; semiconductor detector; thallium bromide;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2008.924086

Filename

4545133